3nm Process Voltage Temperature Monitor IP

Omni Design Technologies has introduced its latest innovation in the form of a high-precision, core-voltage only (0.75 V), silicon-embedded process, voltage, and temperature monitor (PVT) IP. The ODT-PVT-ULP-001C-3 PVT monitor offers a seamless integration process, requiring just a single core-voltage supply and a digital interface. This eliminates the need for additional supply voltage, ensuring precise and localized monitoring near critical digital subsystems.

The ODT-PVT-ULP-001C-3 is an ultra-low power temperature, voltage, and process monitor crafted using a 3nm CMOS process. It functions across a temperature range of -40°C to 150°C. The voltage monitor accommodates four differential or single-ended inputs with a voltage range of up to ±0.75 V. Users can trigger an on-demand temperature or voltage measurement using the one-shot mode. In standby mode, the entire block operates at ultra-low power. Additionally, the process monitor provides insights into the process variation of core PMOS and NMOS transistors, as well as I/O PMOS and NMOS devices.

The evolution of advanced 3nm process nodes presents challenges related to thermal activity and dissipation. To address this, designers often incorporate guard bands into their designs, impacting the performance-per-dollar ratio. The Omni PVT monitor, integrated into a 3nm product, facilitates optimized performance with minimal guard bands. It offers various advantages, including:

• Simple deployment and integration into complex digital or mixed-signal chips using a single core-voltage supply rail.
• Setting interrupts for critical temperature thresholds to enable system adjustments and maximize performance through Dynamic Voltage and Frequency Scaling (DVFS).
• Monitoring and mitigating silicon ageing, reliability issues, and side channel security attacks in the long term.
• Collecting thermal profile data for enhanced analysis and future product design.

Dr. Kush Gulati, President and CEO of Omni Design Technologies, emphasized the significance of the core voltage PVT monitor for advanced 3nm designs. He highlighted the efficiency gains achieved through the PVT monitoring solution, particularly in data center silicon performance. Dr. Gulati stated, “Saving even 1% power in the data center through dynamic voltage and frequency scaling using the Omni Design PVT solution can save over $3M a year in operating costs.”