UK-based analog IP design tool developer Thalia has recently announced a significant update to its Amalia tool, introducing parasitic estimation capabilities. The release of version 24.2 of the Thalia AMALIA tool marks a milestone in semiconductor design by addressing the complex challenge of accurate parasitic estimation.
By incorporating extracted parasitics from the source design during the circuit porting phase, the latest version of the Amalia tool provides early estimates of parasitics, enhancing the accuracy of the ported schematic. This innovative approach reduces the reliance on multiple post-layout parasitic extraction (PEX) iterations by up to 30%, particularly benefiting high-frequency applications and smaller process technology nodes where precision and efficiency are crucial.
One of the key advantages of the new parasitic estimation feature is the streamlined design process it offers. Skilled designers no longer need to manually estimate parasitics, saving valuable time and resources while expediting the design verification process. This automation not only improves efficiency but also ensures a more reliable and consistent design outcome.
According to Syed Ahmad, VP of Product Development at Thalia, "Estimated parasitics in AMALIA is a testament to our commitment to innovation and the tangible benefits it brings to our customers." The company's dedication to pushing the boundaries of design tools is evident in this latest enhancement, which aims to empower semiconductor designers with advanced capabilities.
In addition to the parasitic estimation feature, AMALIA 24.2 introduces other enhancements to further enhance the IP migration experience. The new design centering assistant feature assists in identifying critical devices that impact performance, enabling precise adjustments for optimal results. Moreover, updates to the advanced device mapping functionality leverage AI/ML-driven auto device recommendations, streamlining the device selection process and eliminating the need for manual intervention.